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| GIM>Investigación>Publicaciones |
| PUBLICACIONES originadas dentro del proyecto: "Técnicas de Test para Circuitos Mi..." ordenadas por fecha |
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| 2005 |
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Yolanda Lechuga, Román Mozuelos, Miguel Angel Allende, Mar Martínez, Salvador Bracho
"Fault detection in switched current circuits using built-in transient current sensors"
Journal of Electronic Testing-Theory and Applications 21 (6): 583-598. 2005-12 |
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Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Test of a Switched Capacitor ADC by a Built-In Charge Sensor"
Microelectronics Journal 36 (12): 1064-1072. 2005-11 |
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Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Design for Test of High-Speed Folded ADCs"
XX Conference on
Design of Circuits and Integrated Systems(DCIS 2005) Lisboa(P). 2005-11 |
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Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Test de Preamplificadores en Convertidores A/D Doblados"
Proc. of the XII Annual Seminar on Automatic Control, Industrial Electronics and Instrumentation (SAAEI 2005), Santander. 2005-09 |
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Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Test of Averaged Preamplifiers in Folded ADCs "
11th IEEE International Mixed-Signals Testing Workshop (IMSTW 2005) Cannes(F). 2005-06 |
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| 2004 |
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Román Mozuelos, Yolanda Lechuga, Miguel Angel Allende, Mar Martínez, Salvador Bracho
"Experimental Evaluation of a Built-in Current Sensor for Analog Circuits"
XIX Conference on Design of Circuits and Integrated Systems (DCIS2004). Bordeaux (France). 2004-11 |
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Yolanda Lechuga, Román Mozuelos, Miguel Angel Allende, Mar Martínez, Salvador Bracho
"Experimental Analysis of Transient Current Test Based on dIDD Variations in S2I Memory Cells"
XIX Conference on Design of Circuits and Integrated Systems (DCIS2004). Bordeaux (France). 2004-11 |
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Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Characterization of an SC ADC by a Built-In Charge Sensor"
10th International Mixed-Signal Testing Workshop (IMSTW2004). Portland (USA). 2004-06 |
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| 2003 |
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Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Dynamic Current Testing Strategies for S2I Algorithmic A/D Converters"
XVIII Conference on Design of Circuits and Integrated Systems (DCIS2003). Ciudad Real (Spain). 2003-11 |
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Román Mozuelos, Yolanda Lechuga, Mar Martínez, Salvador Bracho
"SC Algorithmic ADC Test with a Built-In Charge Sensor"
XVIII Conference on Design of Circuits and Integrated Systems (DCIS2003). Ciudad Real (Spain). 2003-11 |
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Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Test generation in algorithmic switched current ADCs"
9th International Mixed-Signal Testing Workshop (IMSTW2003). Sevilla. 2003-06 |
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Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Built-In Sensor Based on Current Supply High-Frequency Behaviour"
Electronic Letters, Vol 39, No. 9. 2003-05 |
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Yolanda Lechuga, Mar Martínez, Salvador Bracho
"Fault Detection in Algorithmic ADC Monitoring Charge in SC Converters and Dynamic Current in SI Converters"
IX Workshop IBERCHIP (IWS´2003). La Habana (Cuba). 2003-03 |
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| 2002 |
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Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Fault detection in algorithmic switched-current ADC using built-in sensors"
XVII Conference on Design of Circuits and Integrated Systems (DCIS 2002). Santander. 2002-11 |
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Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Built-in Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal ICs"
Design, Automation and Test in Europe, DATE 2002. Paris (France). 2002-03 |
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Yolanda Lechuga, Román Mozuelos, Mar Martínez, Salvador Bracho
"Hard-to-Detect Faults by Dynamic Current Sensor in Analogue Circuits"
3rd IEEE Latin-American Test Workshop, LATW2002. Montevideo (Uruguay). 2002-02 |
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